Pica Code IR-2026-089 CryoDefects: Understanding Defect Dynamics in Cryogenic Semiconductor Devices Using Physics-Based Modeling

The research activity focuses on developing physics-based simulation methodologies to investigate degradation and reliability phenomena in semiconductor devices operating at cryogenic temperatures, with particular emphasis on dielectric breakdown. The developed methodologies will be validated against experimental data and used to identify the physical mechanisms responsible for the observed behavior.